Parag K. Lala digital circuits, logic circuit testing, VLSI, fault detection, design- for-testability, chapter also discusses test generation for sequential circuits. Digital Circuit Testing and Testability is an easy to use introduction to the practices and techniques in this field. Parag K. Lala writes in a user-friendly and tutorial. An introduction to logic circuit testing / Parag K. Lala coverage of techniques for test generation and testable design of digital electronic circuits/systems.
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Chapter 2 introduces the major concepts of all test generation techniques such as redundancy, fault coverage, sensitization, and backtracking. Book ratings by Goodreads. Books by Parag K.
Digital Circuit Testing and Testability – Parag K. Lala – Google Books
Kanagavaratharajan rated it did not like it Jul 23, Test Algorithms for RAMs. Testable Combinational Logic Circuit Design. Technical Details Mode of access: Test Generation for Combinational Logic Circuits: Classifications Dewey Decimal Class Ad hoc Design Rules for Improving Testability.
Visit our Beautiful Books page and find lovely books for kids, photography lovers and more. Subjects Integrated circuitsTestingVery large scale integrationDigital integrated circuitsFault tolerance. Separate different tags with a comma.
Also Titled Synthesis digital library of engineering and computer science. Clean Architecture Robert C.
Digital Circuit Testing and Testability
Prefer the physical book? Technology Strategy Patterns Eben Hewitt. The material covered in the book should be sufficient for a course, or part of a course, in digital circuit testing for senior-level undergraduate and first-year graduate students in Electrical Engineering and Computer Science. Lala writes in a user-friendly and tutorial style, making the book easy to read, even for the newcomer to fault-tolerant system design.
Testable Combinational Logic Circuit Design: Design of Testable Sequential Circuits. There’s no description for this book yet. There are no discussion topics on this book yet. Lists with This Book. Each informative chapter is self-contained, with little or no previous knowledge of a topic assumed. Digital Circuit Testing and Testability 3.
This text reviews many different techniques and methodologies to show how to design systems that are fault tolerant. The Nostalgia Nerd’s Retro Tech: Goodreads is the world’s largest site for readers with over 50 million reviews.
See 2 questions about Digital Circuit Testing and Testability…. Test Generation for Sequential Circuits: Edited by Open Library Bot.
You also may like to try some of these bookshopswhich may or may not sell this item. He is the author of more than 75 papers, and three books published by Prentice Hall.
Digital Circuit Testing and Testability : Parag K. Lala :
Chapter 3 introduces the key concepts of testability, followed by some ad hoc design-for-testability rules that can be used to enhance testability of combinational circuits. Series Synthesis lectures on digital testagility and systems, ; 17 Synthesis lectures on digital circuits and systems Online ; Login to add to list. Documenting Software Architectures Robert L.
Programmable Logic Controllers Frank D. He received a M. You might also like. Can you add one? Public Private login e. Read, highlight, and take notes, across web, tablet, and phone. Digital circuit testing and testability.
To include a comma in your tag, surround the tag with double quotes. Just a moment while we sign you in to your Goodreads account. Principles of Computer Hardware Alan Clements. Reliability is one of the most important considerations in computer design, and an important part of creating a computer is designing one that is tolerant of faults.
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